How can we make sure our chips work reliably for decades without having decades to test them? In this episode, we dive deep into the topic of silicon carbide (SiC) reliability testing with our expert guest Paul Salmen.
Be sure to check out the training Paul mentions to learn more about gate oxide reliability for CoolSiC™ devices.
Fler avsnitt av Podcast4Engineers
Visa alla avsnitt av Podcast4EngineersPodcast4Engineers med Infineon Technologies AG finns tillgänglig på flera plattformar. Informationen på denna sida kommer från offentliga podd-flöden.
